Integrated luminance and current measurement enables rapid characterization of LEDs and solar cells
Built-in sensors for illuminance, luminance, and white count streamline workflow and reduce manual steps
Customizable software allows tailored measurement setups and efficient data analysis
Supports both LED and solar cell testing with interchangeable riser boards and dedicated software
Compact, space-saving design maximizes lab efficiency and simplifies workflow
Summarized by Shop
Fast and Simple LED Characterization
Perform IVL sweeps, measure current efficiency & power efficiency and track lifetime
Overview | Specifications | Features | Gallery | Software | In the Box | Accessories | Resources and Support
Perform current-voltage-luminance (IVL or JVL) measurements for new LED devices (including OLEDs and QL
Wavelength range
400 nm–750 nm (white count only 400 nm–1050 nm)
Substrate compatibility
T2005B/S211 20 x 15 mm (OLED/PV), T2005E/S2006 25 mm square (PV/OLED)
